Photoreflectance investigations of semiconductor device structures (1995)
Source: Materials Science & Engineering B. Unidade: IF
Assunto: MATÉRIA CONDENSADA
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ABNT
SOARES, J A N T et al. Photoreflectance investigations of semiconductor device structures. Materials Science & Engineering B, v. 35, p. 267-72, 1995Tradução . . Disponível em: https://doi.org/10.1016/0921-5107(95)01340-7. Acesso em: 11 nov. 2024.APA
Soares, J. A. N. T., Beliaev, D., Enderlein, R., Scolfaro, L. M. R., Saito, M., & Leite, J. R. (1995). Photoreflectance investigations of semiconductor device structures. Materials Science & Engineering B, 35, 267-72. doi:10.1016/0921-5107(95)01340-7NLM
Soares JANT, Beliaev D, Enderlein R, Scolfaro LMR, Saito M, Leite JR. Photoreflectance investigations of semiconductor device structures [Internet]. Materials Science & Engineering B. 1995 ;35 267-72.[citado 2024 nov. 11 ] Available from: https://doi.org/10.1016/0921-5107(95)01340-7Vancouver
Soares JANT, Beliaev D, Enderlein R, Scolfaro LMR, Saito M, Leite JR. Photoreflectance investigations of semiconductor device structures [Internet]. Materials Science & Engineering B. 1995 ;35 267-72.[citado 2024 nov. 11 ] Available from: https://doi.org/10.1016/0921-5107(95)01340-7
