Wood, Thomas; Le Rouzo, Judikaël; Flory, François; Coudray, Paul; Mastelaro, Valmor Roberto 
; Pelissari, Pedro; Zílio, Sérgio Carlos
Source: Optical Engineering. Unidade: IFSC
Subjects: ÓPTICA, FILMES FINOS, BLENDAS
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WOOD, Thomas et al. Combination of guided mode and photometric optical metrology methods for precise determination of refractive index dispersion: application to polymer blend and ceramic thin films for gas sensors. Optical Engineering, v. 52, n. 9, p. 094104-1-094104-10, 2013Tradução . . Disponível em: https://doi.org/10.1117/1.OE.52.9.094104. Acesso em: 16 nov. 2024.APA
Wood, T., Le Rouzo, J., Flory, F., Coudray, P., Mastelaro, V. R., Pelissari, P., & Zílio, S. C. (2013). Combination of guided mode and photometric optical metrology methods for precise determination of refractive index dispersion: application to polymer blend and ceramic thin films for gas sensors. Optical Engineering, 52( 9), 094104-1-094104-10. doi:10.1117/1.OE.52.9.094104NLM
Wood T, Le Rouzo J, Flory F, Coudray P, Mastelaro VR, Pelissari P, Zílio SC. Combination of guided mode and photometric optical metrology methods for precise determination of refractive index dispersion: application to polymer blend and ceramic thin films for gas sensors [Internet]. Optical Engineering. 2013 ; 52( 9): 094104-1-094104-10.[citado 2024 nov. 16 ] Available from: https://doi.org/10.1117/1.OE.52.9.094104Vancouver
Wood T, Le Rouzo J, Flory F, Coudray P, Mastelaro VR, Pelissari P, Zílio SC. Combination of guided mode and photometric optical metrology methods for precise determination of refractive index dispersion: application to polymer blend and ceramic thin films for gas sensors [Internet]. Optical Engineering. 2013 ; 52( 9): 094104-1-094104-10.[citado 2024 nov. 16 ] Available from: https://doi.org/10.1117/1.OE.52.9.094104
