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Filtros : "IFSC031" Removidos: "PCS" "Zanatta, Antonio Ricardo" Limpar

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  • Artigo de periodico

    Nonresonant third-order nonlinearity of antimony glasses at telecom wavelengths (2006)

    Gómez, Luis A.; Araújo, Cid B.; Messias, D. N.; Misoguti, Lino; Zílio, Sérgio Carlos; Nalin, M.; Messaddeq, Y.

    Source: Journal of Applied Physics. Unidade: IFSC

    Subjects: VIDRO, LASER, ÓPTICA

    Acesso à fonteDOIHow to cite
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    • ABNT

      GÓMEZ, Luis A. et al. Nonresonant third-order nonlinearity of antimony glasses at telecom wavelengths. Journal of Applied Physics, v. 100, n. 11, p. 116105-1-116105-3, 2006Tradução . . Disponível em: https://doi.org/10.1063/1.2388045. Acesso em: 03 jul. 2024.

    • APA

      Gómez, L. A., Araújo, C. B., Messias, D. N., Misoguti, L., Zílio, S. C., Nalin, M., & Messaddeq, Y. (2006). Nonresonant third-order nonlinearity of antimony glasses at telecom wavelengths. Journal of Applied Physics, 100( 11), 116105-1-116105-3. doi:10.1063/1.2388045

    • NLM

      Gómez LA, Araújo CB, Messias DN, Misoguti L, Zílio SC, Nalin M, Messaddeq Y. Nonresonant third-order nonlinearity of antimony glasses at telecom wavelengths [Internet]. Journal of Applied Physics. 2006 ; 100( 11): 116105-1-116105-3.[citado 2024 jul. 03 ] Available from: https://doi.org/10.1063/1.2388045

    • Vancouver

      Gómez LA, Araújo CB, Messias DN, Misoguti L, Zílio SC, Nalin M, Messaddeq Y. Nonresonant third-order nonlinearity of antimony glasses at telecom wavelengths [Internet]. Journal of Applied Physics. 2006 ; 100( 11): 116105-1-116105-3.[citado 2024 jul. 03 ] Available from: https://doi.org/10.1063/1.2388045

  • Artigo de periodico

    Non-hydrostatic pressure induced structural phase transitions of silicon analyzed by Raman scattering (2006)

    Pizani, Paulo Sérgio; Jasinevicius, Renato Goulart; Zanatta, Ricardo Antonio

    Source: Defect and Diffusion Forum. Unidades: EESC, IFSC

    Subjects: SILICONE, ESPECTROSCOPIA RAMAN, MUDANÇA DE FASE

    How to cite
    A citação é gerada automaticamente e pode não estar totalmente de acordo com as normas

    • ABNT

      PIZANI, Paulo Sérgio e JASINEVICIUS, Renato Goulart e ZANATTA, Ricardo Antonio. Non-hydrostatic pressure induced structural phase transitions of silicon analyzed by Raman scattering. Defect and Diffusion Forum, v. 258-260, p. 276-281, 2006Tradução . . Acesso em: 03 jul. 2024.

    • APA

      Pizani, P. S., Jasinevicius, R. G., & Zanatta, R. A. (2006). Non-hydrostatic pressure induced structural phase transitions of silicon analyzed by Raman scattering. Defect and Diffusion Forum, 258-260, 276-281.

    • NLM

      Pizani PS, Jasinevicius RG, Zanatta RA. Non-hydrostatic pressure induced structural phase transitions of silicon analyzed by Raman scattering. Defect and Diffusion Forum. 2006 ; 258-260 276-281.[citado 2024 jul. 03 ]

    • Vancouver

      Pizani PS, Jasinevicius RG, Zanatta RA. Non-hydrostatic pressure induced structural phase transitions of silicon analyzed by Raman scattering. Defect and Diffusion Forum. 2006 ; 258-260 276-281.[citado 2024 jul. 03 ]
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