Filtros : " IFSC032" "Indexado no Science Citation Index sem fator" Removido: "FRANCO, DOUGLAS WAGNER" Limpar

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  • Source: Proceedings of SPIE. Conference titles: Multiphoton Microscopy in the Biomedical Sciences. Unidade: IFSC

    Subjects: ÓPTICA NÃO LINEAR, POLARIZAÇÃO, LASER

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    • ABNT

      MIGUEZ, M. L. et al. High-resolution nonlinear ellipse rotation measurements for 3D microscopy. Proceedings of SPIE. Bellingham: International Society for Optical Engineering - SPIE. Disponível em: https://doi.org/10.1117/12.2077819. Acesso em: 05 jul. 2024. , 2015
    • APA

      Miguez, M. L., Barbano, E. C., Coura, J. A., Zílio, S. C., & Misoguti, L. (2015). High-resolution nonlinear ellipse rotation measurements for 3D microscopy. Proceedings of SPIE. Bellingham: International Society for Optical Engineering - SPIE. doi:10.1117/12.2077819
    • NLM

      Miguez ML, Barbano EC, Coura JA, Zílio SC, Misoguti L. High-resolution nonlinear ellipse rotation measurements for 3D microscopy [Internet]. Proceedings of SPIE. 2015 ; 9329 93292L-1-93292L-4.[citado 2024 jul. 05 ] Available from: https://doi.org/10.1117/12.2077819
    • Vancouver

      Miguez ML, Barbano EC, Coura JA, Zílio SC, Misoguti L. High-resolution nonlinear ellipse rotation measurements for 3D microscopy [Internet]. Proceedings of SPIE. 2015 ; 9329 93292L-1-93292L-4.[citado 2024 jul. 05 ] Available from: https://doi.org/10.1117/12.2077819
  • Source: Proceedings of SPIE. Conference titles: Nonlinear Frequency Generation and Conversion: Materials, Devices, and Applications. Unidade: IFSC

    Subjects: POLARIZAÇÃO, ÓPTICA NÃO LINEAR

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      MIGUEZ, M. L. et al. New simple method for measuring nonlinear polarization ellipse rotation with high precision using a dual-phase lock-in. Proceedings of SPIE. Bellingham: International Society for Optical Engineering - SPIE. Disponível em: https://doi.org/10.1117/12.2037065. Acesso em: 05 jul. 2024. , 2014
    • APA

      Miguez, M. L., Barbano, E. C., Zílio, S. C., & Misoguti, L. (2014). New simple method for measuring nonlinear polarization ellipse rotation with high precision using a dual-phase lock-in. Proceedings of SPIE. Bellingham: International Society for Optical Engineering - SPIE. doi:10.1117/12.2037065
    • NLM

      Miguez ML, Barbano EC, Zílio SC, Misoguti L. New simple method for measuring nonlinear polarization ellipse rotation with high precision using a dual-phase lock-in [Internet]. Proceedings of SPIE. 2014 ;8964 89641C-1-89641C-5.[citado 2024 jul. 05 ] Available from: https://doi.org/10.1117/12.2037065
    • Vancouver

      Miguez ML, Barbano EC, Zílio SC, Misoguti L. New simple method for measuring nonlinear polarization ellipse rotation with high precision using a dual-phase lock-in [Internet]. Proceedings of SPIE. 2014 ;8964 89641C-1-89641C-5.[citado 2024 jul. 05 ] Available from: https://doi.org/10.1117/12.2037065
  • Source: Proceedings of SPIE. Conference titles: Optical Components and Materials. Unidade: IFSC

    Subjects: FILMES FINOS, ESPECTROSCOPIA, TERRAS RARAS

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      RIVERA, V. A. G. et al. High near-infrared emission intensity of Er3+-doped zirconium oxide films on a Si(100) substrate. Proceedings of SPIE. Bellingham: International Society for Optical Engineering - SPIE. Disponível em: https://doi.org/10.1117/12.2004783. Acesso em: 05 jul. 2024. , 2013
    • APA

      Rivera, V. A. G., Ferri, F. A., Clabel H., J. L., Kawamura, M. K., Silva, M. de A. P. da, Nunes, L. A. de O., et al. (2013). High near-infrared emission intensity of Er3+-doped zirconium oxide films on a Si(100) substrate. Proceedings of SPIE. Bellingham: International Society for Optical Engineering - SPIE. doi:10.1117/12.2004783
    • NLM

      Rivera VAG, Ferri FA, Clabel H. JL, Kawamura MK, Silva M de AP da, Nunes LA de O, Siu Li M, Marega Júnior E. High near-infrared emission intensity of Er3+-doped zirconium oxide films on a Si(100) substrate [Internet]. Proceedings of SPIE. 2013 ; 8621 86211K-1-86211K-9.[citado 2024 jul. 05 ] Available from: https://doi.org/10.1117/12.2004783
    • Vancouver

      Rivera VAG, Ferri FA, Clabel H. JL, Kawamura MK, Silva M de AP da, Nunes LA de O, Siu Li M, Marega Júnior E. High near-infrared emission intensity of Er3+-doped zirconium oxide films on a Si(100) substrate [Internet]. Proceedings of SPIE. 2013 ; 8621 86211K-1-86211K-9.[citado 2024 jul. 05 ] Available from: https://doi.org/10.1117/12.2004783
  • Source: Optical Materials Express. Unidade: IFSC

    Subjects: FOTÔNICA, PLATINA, EMISSÃO DA LUZ

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      VIVAS, Marcelo G. et al. Broadband three-photon absorption spectra of platinum acetylide complexes. Optical Materials Express, v. 1, n. 4, p. 700-710, 2011Tradução . . Disponível em: https://doi.org/10.1364/OME.1.000700. Acesso em: 05 jul. 2024.
    • APA

      Vivas, M. G., Piovesan, E., Silva, D. L., Cooper, T. M., De Boni, L., & Mendonça, C. R. (2011). Broadband three-photon absorption spectra of platinum acetylide complexes. Optical Materials Express, 1( 4), 700-710. doi:10.1364/OME.1.000700
    • NLM

      Vivas MG, Piovesan E, Silva DL, Cooper TM, De Boni L, Mendonça CR. Broadband three-photon absorption spectra of platinum acetylide complexes [Internet]. Optical Materials Express. 2011 ; 1( 4): 700-710.[citado 2024 jul. 05 ] Available from: https://doi.org/10.1364/OME.1.000700
    • Vancouver

      Vivas MG, Piovesan E, Silva DL, Cooper TM, De Boni L, Mendonça CR. Broadband three-photon absorption spectra of platinum acetylide complexes [Internet]. Optical Materials Express. 2011 ; 1( 4): 700-710.[citado 2024 jul. 05 ] Available from: https://doi.org/10.1364/OME.1.000700

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