Filtros : "Universidade Nova de Lisboa (NOVA)" "Faria, Roberto Mendonça" Removidos: "FM-MOG" "GAVIM, ANDERSON EMANUEL XIMIM" "FFLCH/USP" Limpar

Filtros



Refine with date range


  • Source: Nanotechnology. Unidade: IFSC

    Assunto: FÍSICA DA MATÉRIA CONDENSADA

    Acesso à fonteDOIHow to cite
    A citação é gerada automaticamente e pode não estar totalmente de acordo com as normas
    • ABNT

      LOBO, R. F. M. et al. The morphology of layer-by-layer films of polymer/polyelectrolyte studied by atomic force microscopy. Nanotechnology, v. 14, n. Ja 2003, p. 101-108, 2003Tradução . . Disponível em: https://doi.org/10.1088/0957-4484/14/1/322. Acesso em: 30 jun. 2024.
    • APA

      Lobo, R. F. M., Silva, M. de A. P. da, Raposo, M., Faria, R. M., & Oliveira Junior, O. N. de. (2003). The morphology of layer-by-layer films of polymer/polyelectrolyte studied by atomic force microscopy. Nanotechnology, 14( Ja 2003), 101-108. doi:10.1088/0957-4484/14/1/322
    • NLM

      Lobo RFM, Silva M de AP da, Raposo M, Faria RM, Oliveira Junior ON de. The morphology of layer-by-layer films of polymer/polyelectrolyte studied by atomic force microscopy [Internet]. Nanotechnology. 2003 ; 14( Ja 2003): 101-108.[citado 2024 jun. 30 ] Available from: https://doi.org/10.1088/0957-4484/14/1/322
    • Vancouver

      Lobo RFM, Silva M de AP da, Raposo M, Faria RM, Oliveira Junior ON de. The morphology of layer-by-layer films of polymer/polyelectrolyte studied by atomic force microscopy [Internet]. Nanotechnology. 2003 ; 14( Ja 2003): 101-108.[citado 2024 jun. 30 ] Available from: https://doi.org/10.1088/0957-4484/14/1/322
  • Source: Nanotechnology. Unidade: IFSC

    Assunto: MATÉRIA CONDENSADA

    Acesso à fonteDOIHow to cite
    A citação é gerada automaticamente e pode não estar totalmente de acordo com as normas
    • ABNT

      LOBO, R. F. M. et al. In situ thickness measurements of ultra-thin multilayer polymer films by atomic force microscopy. Nanotechnology, v. 10, p. 389-393, 1999Tradução . . Disponível em: https://doi.org/10.1088/0957-4484/10/4/305. Acesso em: 30 jun. 2024.
    • APA

      Lobo, R. F. M., Silva, M. A. P., Raposo, M., Faria, R. M., & Oliveira Junior, O. N. de. (1999). In situ thickness measurements of ultra-thin multilayer polymer films by atomic force microscopy. Nanotechnology, 10, 389-393. doi:10.1088/0957-4484/10/4/305
    • NLM

      Lobo RFM, Silva MAP, Raposo M, Faria RM, Oliveira Junior ON de. In situ thickness measurements of ultra-thin multilayer polymer films by atomic force microscopy [Internet]. Nanotechnology. 1999 ; 10 389-393.[citado 2024 jun. 30 ] Available from: https://doi.org/10.1088/0957-4484/10/4/305
    • Vancouver

      Lobo RFM, Silva MAP, Raposo M, Faria RM, Oliveira Junior ON de. In situ thickness measurements of ultra-thin multilayer polymer films by atomic force microscopy [Internet]. Nanotechnology. 1999 ; 10 389-393.[citado 2024 jun. 30 ] Available from: https://doi.org/10.1088/0957-4484/10/4/305

Digital Library of Intellectual Production of Universidade de São Paulo     2012 - 2024