In situ thickness measurements of ultra-thin multilayer polymer films by atomic force microscopy (1999)
- Authors:
- USP affiliated authors: FARIA, ROBERTO MENDONCA - IFSC ; OLIVEIRA JUNIOR, OSVALDO NOVAIS DE - IFSC
- Unidade: IFSC
- DOI: 10.1088/0957-4484/10/4/305
- Assunto: MATÉRIA CONDENSADA
- Language: Inglês
- Imprenta:
- Source:
- Título do periódico: Nanotechnology
- Volume/Número/Paginação/Ano: v. 10, p. 389-393, 1999
- Este periódico é de assinatura
- Este artigo NÃO é de acesso aberto
- Cor do Acesso Aberto: closed
-
ABNT
LOBO, R. F. M. et al. In situ thickness measurements of ultra-thin multilayer polymer films by atomic force microscopy. Nanotechnology, v. 10, p. 389-393, 1999Tradução . . Disponível em: https://doi.org/10.1088/0957-4484/10/4/305. Acesso em: 23 abr. 2024. -
APA
Lobo, R. F. M., Silva, M. A. P., Raposo, M., Faria, R. M., & Oliveira Junior, O. N. de. (1999). In situ thickness measurements of ultra-thin multilayer polymer films by atomic force microscopy. Nanotechnology, 10, 389-393. doi:10.1088/0957-4484/10/4/305 -
NLM
Lobo RFM, Silva MAP, Raposo M, Faria RM, Oliveira Junior ON de. In situ thickness measurements of ultra-thin multilayer polymer films by atomic force microscopy [Internet]. Nanotechnology. 1999 ; 10 389-393.[citado 2024 abr. 23 ] Available from: https://doi.org/10.1088/0957-4484/10/4/305 -
Vancouver
Lobo RFM, Silva MAP, Raposo M, Faria RM, Oliveira Junior ON de. In situ thickness measurements of ultra-thin multilayer polymer films by atomic force microscopy [Internet]. Nanotechnology. 1999 ; 10 389-393.[citado 2024 abr. 23 ] Available from: https://doi.org/10.1088/0957-4484/10/4/305 - Effect of doping on the fabrication of langmuir and langmuir-blodgett of poly (o-ethoxyaniline)
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Informações sobre o DOI: 10.1088/0957-4484/10/4/305 (Fonte: oaDOI API)
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