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Filtros : "Laboratoire de Physique de la Matiére Condensée, École Polytechnique, Palaiseau - France" "IQSC-SQM" Removidos: "EESC-SMM" "ECOAGROEC" Limpar

Filtros

Artigo de periodico
On the vSiO infrared absrption of polysiloxane films (2012)
Chazalviel, Jean-Nöel; Rodrigues Filho, Ubirajara Pereira
Source: Thin Solid Films. Unidade: IQSC
Assunto: FILMES FINOS
A citação é gerada automaticamente e pode não estar totalmente de acordo com as normas
ABNT
CHAZALVIEL, Jean-Nöel e RODRIGUES FILHO, Ubirajara Pereira. On the vSiO infrared absrption of polysiloxane films. Thin Solid Films, v. 520, n. 11, p. 3918-3921, 2012Tradução . . Disponível em: https://doi.org/10.1016/j.tsf.2012.01.046. Acesso em: 01 jul. 2024.
APA
Chazalviel, J. -N., & Rodrigues Filho, U. P. (2012). On the vSiO infrared absrption of polysiloxane films. Thin Solid Films, 520( 11), 3918-3921. doi:10.1016/j.tsf.2012.01.046
NLM
Chazalviel J-N, Rodrigues Filho UP. On the vSiO infrared absrption of polysiloxane films [Internet]. Thin Solid Films. 2012 ; 520( 11): 3918-3921.[citado 2024 jul. 01 ] Available from: https://doi.org/10.1016/j.tsf.2012.01.046
Vancouver
Chazalviel J-N, Rodrigues Filho UP. On the vSiO infrared absrption of polysiloxane films [Internet]. Thin Solid Films. 2012 ; 520( 11): 3918-3921.[citado 2024 jul. 01 ] Available from: https://doi.org/10.1016/j.tsf.2012.01.046
Trabalho de evento-resumo periodico
Time-of-flight secondary ion mass spectroscopy of organic monolayer on Si(111) (2007)
Rodrigues Filho, Ubirajara Pereira ; Henry-de-Villeneuve, Catherine; Chazalviel, Jean-Nöel; Ozanam, François; Brison, Jéremy; Douhard, Bastien; Pireaux, Jean-Jacques; Houssiau, Laurent; Allongue, Philippe
Source: Journal of Electron Spectroscopy and Related Phenomena. Conference titles: International Conference on Electronic Spectroscopy and Structure. Unidade: IQSC
Assunto: ESPECTROSCOPIA
A citação é gerada automaticamente e pode não estar totalmente de acordo com as normas
ABNT
RODRIGUES FILHO, Ubirajara Pereira et al. Time-of-flight secondary ion mass spectroscopy of organic monolayer on Si(111). Journal of Electron Spectroscopy and Related Phenomena. Amsterdam: Elsevier Science. . Acesso em: 01 jul. 2024. , 2007
APA
Rodrigues Filho, U. P., Henry-de-Villeneuve, C., Chazalviel, J. -N., Ozanam, F., Brison, J., Douhard, B., et al. (2007). Time-of-flight secondary ion mass spectroscopy of organic monolayer on Si(111). Journal of Electron Spectroscopy and Related Phenomena. Amsterdam: Elsevier Science.
NLM
Rodrigues Filho UP, Henry-de-Villeneuve C, Chazalviel J-N, Ozanam F, Brison J, Douhard B, Pireaux J-J, Houssiau L, Allongue P. Time-of-flight secondary ion mass spectroscopy of organic monolayer on Si(111). Journal of Electron Spectroscopy and Related Phenomena. 2007 ; 156/158 xx-civ.[citado 2024 jul. 01 ]
Vancouver
Rodrigues Filho UP, Henry-de-Villeneuve C, Chazalviel J-N, Ozanam F, Brison J, Douhard B, Pireaux J-J, Houssiau L, Allongue P. Time-of-flight secondary ion mass spectroscopy of organic monolayer on Si(111). Journal of Electron Spectroscopy and Related Phenomena. 2007 ; 156/158 xx-civ.[citado 2024 jul. 01 ]

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