Probing charge density in organic transistors by Charge Modulation Microscopy (CMM) (2018)
Gomes, Douglas José Correia; Pace, Giuseppina; Caironi, Mario; Miranda, Paulo Barbeitas 
Source: Program. Conference titles: Brazilian MRS Meeting. Unidade: IFSC
Subjects: POLÍMEROS (MATERIAIS), SEMICONDUTORES, FILMES FINOS
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ABNT
GOMES, Douglas José Correia et al. Probing charge density in organic transistors by Charge Modulation Microscopy (CMM). 2018, Anais.. Rio de Janeiro: Sociedade Brasileira de Pesquisa em Materiais - SBPMat, 2018. Disponível em: https://new.eventweb.com.br/xviisbpmat/specific-files/grabFile.php?codigo=4GGW. Acesso em: 11 out. 2024.APA
Gomes, D. J. C., Pace, G., Caironi, M., & Miranda, P. B. (2018). Probing charge density in organic transistors by Charge Modulation Microscopy (CMM). In Program. Rio de Janeiro: Sociedade Brasileira de Pesquisa em Materiais - SBPMat. Recuperado de https://new.eventweb.com.br/xviisbpmat/specific-files/grabFile.php?codigo=4GGWNLM
Gomes DJC, Pace G, Caironi M, Miranda PB. Probing charge density in organic transistors by Charge Modulation Microscopy (CMM) [Internet]. Program. 2018 ;[citado 2024 out. 11 ] Available from: https://new.eventweb.com.br/xviisbpmat/specific-files/grabFile.php?codigo=4GGWVancouver
Gomes DJC, Pace G, Caironi M, Miranda PB. Probing charge density in organic transistors by Charge Modulation Microscopy (CMM) [Internet]. Program. 2018 ;[citado 2024 out. 11 ] Available from: https://new.eventweb.com.br/xviisbpmat/specific-files/grabFile.php?codigo=4GGW
