Atomic-scale characterization of interfaces in the GaAs/AlAs superlattices (1995)
Pusep, Yuri A 
; Silva, S.; Galzerani, J. C.; Lubyshev, D. I.; Basmaji, Pierre
Source: Abstracts. Conference titles: International Conference on Low Dimensional Structures and Devices - LDSD. Unidade: IFSC
Assunto: FÍSICA
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ABNT
PUSEP, Yuri A et al. Atomic-scale characterization of interfaces in the GaAs/AlAs superlattices. 1995, Anais.. Singapore: Instituto de Física de São Carlos, Universidade de São Paulo, 1995. . Acesso em: 19 out. 2024.APA
Pusep, Y. A., Silva, S., Galzerani, J. C., Lubyshev, D. I., & Basmaji, P. (1995). Atomic-scale characterization of interfaces in the GaAs/AlAs superlattices. In Abstracts. Singapore: Instituto de Física de São Carlos, Universidade de São Paulo.NLM
Pusep YA, Silva S, Galzerani JC, Lubyshev DI, Basmaji P. Atomic-scale characterization of interfaces in the GaAs/AlAs superlattices. Abstracts. 1995 ;[citado 2024 out. 19 ]Vancouver
Pusep YA, Silva S, Galzerani JC, Lubyshev DI, Basmaji P. Atomic-scale characterization of interfaces in the GaAs/AlAs superlattices. Abstracts. 1995 ;[citado 2024 out. 19 ]
