Incorporation of Europium in Bi2Te3 Topological Insulator Epitaxial Films (2020)
Source: Journal of Physical Chemistry C. Unidade: IF
Subjects: EURÓPIO, EPITAXIA POR FEIXE MOLECULAR, DIFRAÇÃO POR RAIOS X, MICROSCOPIA ELETRÔNICA DE VARREDURA
ABNT
FORNARI, Celso I e MORELHÃO, Sergio Luiz. Incorporation of Europium in Bi2Te3 Topological Insulator Epitaxial Films. Journal of Physical Chemistry C, v. 124, n. 29, p. 16048–16057, 2020Tradução . . Disponível em: https://doi.org/10.1021/acs.jpcc.0c05077. Acesso em: 22 ago. 2024.APA
Fornari, C. I., & Morelhão, S. L. (2020). Incorporation of Europium in Bi2Te3 Topological Insulator Epitaxial Films. Journal of Physical Chemistry C, 124( 29), 16048–16057. doi:10.1021/acs.jpcc.0c05077NLM
Fornari CI, Morelhão SL. Incorporation of Europium in Bi2Te3 Topological Insulator Epitaxial Films [Internet]. Journal of Physical Chemistry C. 2020 ; 124( 29): 16048–16057.[citado 2024 ago. 22 ] Available from: https://doi.org/10.1021/acs.jpcc.0c05077Vancouver
Fornari CI, Morelhão SL. Incorporation of Europium in Bi2Te3 Topological Insulator Epitaxial Films [Internet]. Journal of Physical Chemistry C. 2020 ; 124( 29): 16048–16057.[citado 2024 ago. 22 ] Available from: https://doi.org/10.1021/acs.jpcc.0c05077