Statistical modeling of epitaxial thin films of an intrinsic antiferromagnetic topological insulator (2022)
- Authors:
- USP affiliated authors: MORELHAO, SERGIO LUIZ - IF ; PENACCHIO, RAFAELA FELIX DA SILVA - IF
- Unidade: IF
- DOI: 10.1016/j.tsf.2022.139183
- Subjects: FÍSICA DA MATÉRIA CONDENSADA; FILMES FINOS; DIFRAÇÃO POR RAIOS X; MATERIAIS NANOESTRUTURADOS; EPITAXIA POR FEIXE MOLECULAR; CAMPO MAGNÉTICO
- Keywords: Magnetic topological insulators; Structure modeling; X-ray dynamical diffraction; Van der Waals epitaxy
- Agências de fomento:
- Language: Inglês
- Imprenta:
- Source:
- Título: Thin Solid Films
- ISSN: 0040-6090
- Volume/Número/Paginação/Ano: v. 750, 31 de maio de 2022, número do artigo: 139183
- Este periódico é de assinatura
- Este artigo NÃO é de acesso aberto
- Cor do Acesso Aberto: closed
-
ABNT
PENACCHIO, Rafaela Felix da Silva et al. Statistical modeling of epitaxial thin films of an intrinsic antiferromagnetic topological insulator. Thin Solid Films, v. 750, 2022Tradução . . Disponível em: https://doi.org/10.1016/j.tsf.2022.139183. Acesso em: 29 dez. 2025. -
APA
Penacchio, R. F. da S., Fornari, C. I., Camillo, Y. G., Kagerer, P., Buchberger, S., Kamp, M., et al. (2022). Statistical modeling of epitaxial thin films of an intrinsic antiferromagnetic topological insulator. Thin Solid Films, 750. doi:10.1016/j.tsf.2022.139183 -
NLM
Penacchio RF da S, Fornari CI, Camillo YG, Kagerer P, Buchberger S, Kamp M, Bentmann H, Reinert F, Morelhão SL. Statistical modeling of epitaxial thin films of an intrinsic antiferromagnetic topological insulator [Internet]. Thin Solid Films. 2022 ; 750[citado 2025 dez. 29 ] Available from: https://doi.org/10.1016/j.tsf.2022.139183 -
Vancouver
Penacchio RF da S, Fornari CI, Camillo YG, Kagerer P, Buchberger S, Kamp M, Bentmann H, Reinert F, Morelhão SL. Statistical modeling of epitaxial thin films of an intrinsic antiferromagnetic topological insulator [Internet]. Thin Solid Films. 2022 ; 750[citado 2025 dez. 29 ] Available from: https://doi.org/10.1016/j.tsf.2022.139183 - Role of nitrogen partial pressure, deposition rate and annealing on stability of beta-W phase
- Simulation of bright and dark diffuse multiple scattering lines in high-flux synchrotron X-ray experiments
- Introduction to Python Dynamic Diffraction Toolkit (PyDDT): structural refinement of single crystals via X-ray phase measurements
- A simple recipe to create three-dimensional reciprocal space maps
- Proper interpretation of Scherrer Equation validated by PDDF simulation of silicon nanoclusters
- Study of hydrogen bonds in pure and Fe doped L-Asparagine using in-house dynamic X-ray diffraction
- Implications of size dispersion on X-ray scattering of crystalline nanoparticles: CeO2 as a case study
- Indexing Multiple Diffraction Phenomena in Skutterudites and Amino Acid Single Crystals with a Graphic Tool Optimized for High Flux Synchrotron Sources
- Proper usage of scherrer’s and guinier’s formulas in X-ray analysis of size distribution in systems of monocrystalline 'CE''O'IND.2' nanoparticles
- Two-Dimensional Representation of Bragg-Cones: a Graphical Tool for Studying Single Crystalswith High Flux Synchrotron Sources
Informações sobre o DOI: 10.1016/j.tsf.2022.139183 (Fonte: oaDOI API)
Download do texto completo
| Tipo | Nome | Link | |
|---|---|---|---|
 |
1-s2.0-S0040609022001031-... | Direct link |
How to cite
A citação é gerada automaticamente e pode não estar totalmente de acordo com as normas
