Internal standardization as a strategy to overcome non-spectral interferences in the determination of As, Cd and Pb in mineral fertilizers by synchronous vertical dual view (SVDV) ICP OES (2020)
- Authors:
- Autor USP: VIRGILIO, ALEX - CENA
- Unidade: CENA
- DOI: 10.1039/C9AY02343G
- Subjects: FERTILIZANTES NITROGENADOS; ESPECTROMETRIA; QUÍMICA ANALÍTICA
- Agências de fomento:
- Language: Inglês
- Imprenta:
- Source:
- Título do periódico: Analytical Methods
- ISSN: 1759-9679
- Volume/Número/Paginação/Ano: v. 12, n. 1, p. 39-45, 2020
- Este periódico é de assinatura
- Este artigo NÃO é de acesso aberto
- Cor do Acesso Aberto: closed
-
ABNT
MACHADO, Raquel Cardoso et al. Internal standardization as a strategy to overcome non-spectral interferences in the determination of As, Cd and Pb in mineral fertilizers by synchronous vertical dual view (SVDV) ICP OES. Analytical Methods, v. 12, n. 1, p. 39-45, 2020Tradução . . Disponível em: https://doi.org/10.1039/C9AY02343G. Acesso em: 23 abr. 2024. -
APA
Machado, R. C., Silva, A. B. S., Amaral, C. D. B., Virgilio, A., & Nogueira, A. R. A. (2020). Internal standardization as a strategy to overcome non-spectral interferences in the determination of As, Cd and Pb in mineral fertilizers by synchronous vertical dual view (SVDV) ICP OES. Analytical Methods, 12( 1), 39-45. doi:10.1039/C9AY02343G -
NLM
Machado RC, Silva ABS, Amaral CDB, Virgilio A, Nogueira ARA. Internal standardization as a strategy to overcome non-spectral interferences in the determination of As, Cd and Pb in mineral fertilizers by synchronous vertical dual view (SVDV) ICP OES [Internet]. Analytical Methods. 2020 ; 12( 1): 39-45.[citado 2024 abr. 23 ] Available from: https://doi.org/10.1039/C9AY02343G -
Vancouver
Machado RC, Silva ABS, Amaral CDB, Virgilio A, Nogueira ARA. Internal standardization as a strategy to overcome non-spectral interferences in the determination of As, Cd and Pb in mineral fertilizers by synchronous vertical dual view (SVDV) ICP OES [Internet]. Analytical Methods. 2020 ; 12( 1): 39-45.[citado 2024 abr. 23 ] Available from: https://doi.org/10.1039/C9AY02343G - Determination of elemental content in solder mask samples used in printed circuit boards using different spectroanalytical techniques
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Informações sobre o DOI: 10.1039/C9AY02343G (Fonte: oaDOI API)
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