X-ray data analysis methods for studying in situ crystallization processes - case study of bismuth ferrite (2019)
- Authors:
- USP affiliated authors: MORELHAO, SERGIO LUIZ - IF ; VALERIO, ADRIANA - IF
- Unidade: IF
- Assunto: DIFRAÇÃO POR RAIOS X
- Agências de fomento:
- Language: Inglês
- Imprenta:
- Publisher: Sociedade Brasileira de Física - SBF
- Publisher place: São Paulo
- Date published: 2019
- Source:
- Título do periódico: Abstracts
- Conference titles: Encontro de Outono da Sociedade Brasileira de Física - EOSBF
-
ABNT
VALERIO, Adriana et al. X-ray data analysis methods for studying in situ crystallization processes - case study of bismuth ferrite. 2019, Anais.. São Paulo: Sociedade Brasileira de Física - SBF, 2019. . Acesso em: 19 abr. 2024. -
APA
Valerio, A., Cabral, A. J. de F., Remédios, C. M. R., & Morelhão, S. L. (2019). X-ray data analysis methods for studying in situ crystallization processes - case study of bismuth ferrite. In Abstracts. São Paulo: Sociedade Brasileira de Física - SBF. -
NLM
Valerio A, Cabral AJ de F, Remédios CMR, Morelhão SL. X-ray data analysis methods for studying in situ crystallization processes - case study of bismuth ferrite. Abstracts. 2019 ;[citado 2024 abr. 19 ] -
Vancouver
Valerio A, Cabral AJ de F, Remédios CMR, Morelhão SL. X-ray data analysis methods for studying in situ crystallization processes - case study of bismuth ferrite. Abstracts. 2019 ;[citado 2024 abr. 19 ] - Controlled Formation and Growth Kinetics of Phase-Pure, Crystalline BiFeO3 Nanoparticles
- Metodologias avançadas para estudo de materiais por difração e espalhamento de raios X
- Difusão anômala de micropartículas em células no regime de altas frequências
- Proper interpretation of Scherrer Equation validated by PDDF simulation of silicon nanoclusters
- Study of hydrogen bonds in pure and Fe doped L-Asparagine using in-house dynamic X-ray diffraction
- Two-Dimensional Representation of Bragg-Cones: a Graphical Tool for Studying Single Crystalswith High Flux Synchrotron Sources
- Proper usage of scherrer’s and guinier’s formulas in X-ray analysis of size distribution in systems of monocrystalline 'CE''O'IND.2' nanoparticles
- Indexing Multiple Diffraction Phenomena in Skutterudites and Amino Acid Single Crystals with a Graphic Tool Optimized for High Flux Synchrotron Sources
- High-resolution synchrotron radiation Renninger scan to examine hybrid reflections in InGaP/GaAs(001)
- Enhanced X-ray phase determination by three-beam diffraction
How to cite
A citação é gerada automaticamente e pode não estar totalmente de acordo com as normas
