Photoluminescence and structural study of Sm and Tb-doped TiOx thin films (2016)
- Authors:
- Autor USP: ZANATTA, ANTONIO RICARDO - IFSC
- Unidade: IFSC
- Subjects: FOTOLUMINESCÊNCIA; TERRAS RARAS; SEMICONDUTORES; FILMES FINOS
- Language: Inglês
- Imprenta:
- Publisher: Sociedade Brasileira de Pesquisa em Materiais - SBPMat
- Publisher place: Rio de Janeiro
- Date published: 2016
- Source:
- Título: Program Book
- Conference titles: Brazilian MRS Meeting
-
ABNT
SCOCA, Diego Leonardo Silva e ZANATTA, Antonio Ricardo e ALVAREZ, Fernando. Photoluminescence and structural study of Sm and Tb-doped TiOx thin films. 2016, Anais.. Rio de Janeiro: Sociedade Brasileira de Pesquisa em Materiais - SBPMat, 2016. Disponível em: http://www.eventweb.com.br/xvsbpmat/specific-files/grabFile.php?codigo=B4GB. Acesso em: 04 ago. 2025. -
APA
Scoca, D. L. S., Zanatta, A. R., & Alvarez, F. (2016). Photoluminescence and structural study of Sm and Tb-doped TiOx thin films. In Program Book. Rio de Janeiro: Sociedade Brasileira de Pesquisa em Materiais - SBPMat. Recuperado de http://www.eventweb.com.br/xvsbpmat/specific-files/grabFile.php?codigo=B4GB -
NLM
Scoca DLS, Zanatta AR, Alvarez F. Photoluminescence and structural study of Sm and Tb-doped TiOx thin films [Internet]. Program Book. 2016 ;[citado 2025 ago. 04 ] Available from: http://www.eventweb.com.br/xvsbpmat/specific-files/grabFile.php?codigo=B4GB -
Vancouver
Scoca DLS, Zanatta AR, Alvarez F. Photoluminescence and structural study of Sm and Tb-doped TiOx thin films [Internet]. Program Book. 2016 ;[citado 2025 ago. 04 ] Available from: http://www.eventweb.com.br/xvsbpmat/specific-files/grabFile.php?codigo=B4GB - Optical analysis of cobalt oxide thin films deposited by reactive sputtering
- The metal-induced crystallization of amorphous Si and Ge thin films: fundamentals and advancements
- Defect-mediated excitation of Yb ions in amorphous SiN films
- A critical review on the conversion degree of resin monomers by direct analyses
- The mechanisms behind the enhancement of the near-infrared light emission due to Er+Yb ions in an optical microcavity
- Influence of nickel concentration on the metal-induced crystallization of amorphous silicon thin films
- On the structural and optical properties of rare-earth-doped SiOx films deposited by sputtering
- Laser-induced generation of micrometer-sized luminescent patterns on rare-earth-doped amorphous films
- Técnicas de espectroscopia óptica 1: espalhamento Raman
- Síntese e caracterização de filmes de silício e germânio amorfo dopados com manganês
How to cite
A citação é gerada automaticamente e pode não estar totalmente de acordo com as normas