The metal-induced crystallization of amorphous Si and Ge thin films: fundamentals and advancements (2012)
- Autor:
- Autor USP: ZANATTA, ANTONIO RICARDO - IFSC
- Unidade: IFSC
- Subjects: SILÍCIO; GERMÂNIO; FILMES FINOS (COMPOSIÇÃO;ESTRUTURA;PROPRIEDADES)
- Language: Inglês
- Imprenta:
- Publisher: Sociedade Brasileira de Física - SBF
- Publisher place: São Paulo
- Date published: 2012
- Source:
- Título: Resumos
- Conference titles: Encontro Nacional de Física da Matéria Condensada
-
ABNT
ZANATTA, Antonio Ricardo. The metal-induced crystallization of amorphous Si and Ge thin films: fundamentals and advancements. 2012, Anais.. São Paulo: Sociedade Brasileira de Física - SBF, 2012. Disponível em: http://www.sbf1.sbfisica.org.br/eventos/enfmc/xxxv/sys/resumos/R0811-1.pdf. Acesso em: 04 ago. 2025. -
APA
Zanatta, A. R. (2012). The metal-induced crystallization of amorphous Si and Ge thin films: fundamentals and advancements. In Resumos. São Paulo: Sociedade Brasileira de Física - SBF. Recuperado de http://www.sbf1.sbfisica.org.br/eventos/enfmc/xxxv/sys/resumos/R0811-1.pdf -
NLM
Zanatta AR. The metal-induced crystallization of amorphous Si and Ge thin films: fundamentals and advancements [Internet]. Resumos. 2012 ;[citado 2025 ago. 04 ] Available from: http://www.sbf1.sbfisica.org.br/eventos/enfmc/xxxv/sys/resumos/R0811-1.pdf -
Vancouver
Zanatta AR. The metal-induced crystallization of amorphous Si and Ge thin films: fundamentals and advancements [Internet]. Resumos. 2012 ;[citado 2025 ago. 04 ] Available from: http://www.sbf1.sbfisica.org.br/eventos/enfmc/xxxv/sys/resumos/R0811-1.pdf - Photoluminescence and structural study of Sm and Tb-doped TiOx thin films
- Optical analysis of cobalt oxide thin films deposited by reactive sputtering
- Defect-mediated excitation of Yb ions in amorphous SiN films
- A critical review on the conversion degree of resin monomers by direct analyses
- The mechanisms behind the enhancement of the near-infrared light emission due to Er+Yb ions in an optical microcavity
- Influence of nickel concentration on the metal-induced crystallization of amorphous silicon thin films
- On the structural and optical properties of rare-earth-doped SiOx films deposited by sputtering
- Laser-induced generation of micrometer-sized luminescent patterns on rare-earth-doped amorphous films
- Técnicas de espectroscopia óptica 1: espalhamento Raman
- Síntese e caracterização de filmes de silício e germânio amorfo dopados com manganês
How to cite
A citação é gerada automaticamente e pode não estar totalmente de acordo com as normas