Optical constants and thickness determination of very thin amorphous semiconductor films

Optical constants and thickness determination of very thin amorphous semiconductor films (2002)

Authors:
Autor USP: BIRGIN, ERNESTO JULIAN GOLDBERG - IME
Unidade: IME
DOI: 10.1063/1.1500785
Assunto: FÍSICA
Language: Inglês
Source:
- Título do periódico: Journal of Applied Physics
- ISSN: 0021-8979
- Volume/Número/Paginação/Ano: v. 92, n. 6, p. 3093-3102, 2002

Informações sobre o DOI: 10.1063/1.1500785 (Fonte: oaDOI API)

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ABNT

CHAMBOULEYRON, Ivan Emílio; VENTURA, S. D.; BIRGIN, Ernesto Julian Goldberg; MARTÍNEZ, José Mário. Optical constants and thickness determination of very thin amorphous semiconductor films. Journal of Applied Physics[S.l.], v. 92, n. 6, p. 3093-3102, 2002. Disponível em: < https://doi.org/10.1063/1.1500785 > DOI: 10.1063/1.1500785.
APA

Chambouleyron, I. E., Ventura, S. D., Birgin, E. J. G., & Martínez, J. M. (2002). Optical constants and thickness determination of very thin amorphous semiconductor films. Journal of Applied Physics, 92( 6), 3093-3102. doi:10.1063/1.1500785
NLM

Chambouleyron IE, Ventura SD, Birgin EJG, Martínez JM. Optical constants and thickness determination of very thin amorphous semiconductor films [Internet]. Journal of Applied Physics. 2002 ; 92( 6): 3093-3102.Available from: https://doi.org/10.1063/1.1500785
Vancouver

Chambouleyron IE, Ventura SD, Birgin EJG, Martínez JM. Optical constants and thickness determination of very thin amorphous semiconductor films [Internet]. Journal of Applied Physics. 2002 ; 92( 6): 3093-3102.Available from: https://doi.org/10.1063/1.1500785