Surface analysis of thin films of polyaniline by Atomic Force Microscopy (2001)
- Authors:
- USP affiliated authors: SILVA, MARCELO DE ASSUMPÇÃO PEREIRA DA - IFSC ; FARIA, ROBERTO MENDONCA - IFSC
- Unidade: IFSC
- Subjects: FÍSICA DA MATÉRIA CONDENSADA; POLÍMEROS (QUÍMICA ORGÂNICA)
- Language: Inglês
- Imprenta:
- Publisher: Sociedade Ibero-Americana de Cristais Liquidos
- Publisher place: Maringá
- Date published: 2001
- Source:
- Título: Abstracts
- Conference titles: Ibero-American Workshop on Complex Fluids and their Applications
-
ABNT
SILVA, Marcelo de Assumpção Pereira da e KLEINKE, Mauricio U. e FARIA, Roberto Mendonça. Surface analysis of thin films of polyaniline by Atomic Force Microscopy. 2001, Anais.. Maringá: Sociedade Ibero-Americana de Cristais Liquidos, 2001. . Acesso em: 28 dez. 2025. -
APA
Silva, M. de A. P. da, Kleinke, M. U., & Faria, R. M. (2001). Surface analysis of thin films of polyaniline by Atomic Force Microscopy. In Abstracts. Maringá: Sociedade Ibero-Americana de Cristais Liquidos. -
NLM
Silva M de AP da, Kleinke MU, Faria RM. Surface analysis of thin films of polyaniline by Atomic Force Microscopy. Abstracts. 2001 ;[citado 2025 dez. 28 ] -
Vancouver
Silva M de AP da, Kleinke MU, Faria RM. Surface analysis of thin films of polyaniline by Atomic Force Microscopy. Abstracts. 2001 ;[citado 2025 dez. 28 ] - Soft lithography in ordered-desordered nanostructures of triblock copolymer
- Estudo de filmes finos polimericos usando caracterização paramétrica de imagens obtidas pela técnica de Microscopia de Força Atômica
- Self-organized SEBS-copolymer nanostructures as patterning template
- Fabrication of submicrometric patterns from self-organized structures of block copolymers and transcription on solid surfaces
- SEBS nanostructures replication by soft lithography
- Self-organized periodic sub-micrometric structures from diluted block copolymer solutions
- Estudo de estruturas submicrometricas auto-organizadas de copolimeros
- Surface energy characterization of light-emitting diodes by Atomic Force Microscopy (AFM): contact angle and surface energy determination
- Modeling of SEBS structures during pattern dynamic formation
- Ammonium free self-assembly deposition of CdS luminescent quantum dots on flexible-transparent substrate
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