Thickness measurements of ultra-thin polymeric films using atomic force microscopy (1999)
- Authors:
- USP affiliated authors: SILVA, MARCELO DE ASSUMPCAO PEREIRA DA - IFSC ; OLIVEIRA JUNIOR, OSVALDO NOVAIS DE - IFSC ; FARIA, ROBERTO MENDONCA - IFSC
- Unidade: IFSC
- Assunto: MATÉRIA CONDENSADA
- Language: Inglês
- Imprenta:
- Source:
- Título: Abstracts
- Conference titles: Symposium of the Electrical, Optical and Magnetic Properties of Organic Solidate Materials
-
ABNT
RAPOSO, Maria et al. Thickness measurements of ultra-thin polymeric films using atomic force microscopy. 1999, Anais.. Boston: MRS, 1999. . Acesso em: 15 fev. 2026. -
APA
Raposo, M., Lobo, R. F. M., Silva, M. de A. P. da, Faria, R. M., & Oliveira Junior, O. N. de. (1999). Thickness measurements of ultra-thin polymeric films using atomic force microscopy. In Abstracts. Boston: MRS. -
NLM
Raposo M, Lobo RFM, Silva M de AP da, Faria RM, Oliveira Junior ON de. Thickness measurements of ultra-thin polymeric films using atomic force microscopy. Abstracts. 1999 ;[citado 2026 fev. 15 ] -
Vancouver
Raposo M, Lobo RFM, Silva M de AP da, Faria RM, Oliveira Junior ON de. Thickness measurements of ultra-thin polymeric films using atomic force microscopy. Abstracts. 1999 ;[citado 2026 fev. 15 ] - Layer-by-layer growth morphology of polymer/polyelectrolyte ultra-thin films studied by atomic force microscopy
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