Defects in si thin-film transistors studies by spin-dependent transport (1996)
- Authors:
- Autor USP: GRAEFF, CARLOS FREDERICO DE OLIVEIRA - FFCLRP
- Unidade: FFCLRP
- Assunto: FÍSICA
- Language: Inglês
- Imprenta:
- Publisher: Japan Society of Applied Physics
- Publisher place: Yokohama
- Date published: 1996
- Source:
- Título: Abstracts
- Conference titles: International Conference on Solid State Devices and Materials
-
ABNT
KAWACHI, G et al. Defects in si thin-film transistors studies by spin-dependent transport. 1996, Anais.. Yokohama: Japan Society of Applied Physics, 1996. . Acesso em: 04 mar. 2026. -
APA
Kawachi, G., Graeff, C. F. O., Brandt, M. S., & Stutzmann, M. (1996). Defects in si thin-film transistors studies by spin-dependent transport. In Abstracts. Yokohama: Japan Society of Applied Physics. -
NLM
Kawachi G, Graeff CFO, Brandt MS, Stutzmann M. Defects in si thin-film transistors studies by spin-dependent transport. Abstracts. 1996 ;[citado 2026 mar. 04 ] -
Vancouver
Kawachi G, Graeff CFO, Brandt MS, Stutzmann M. Defects in si thin-film transistors studies by spin-dependent transport. Abstracts. 1996 ;[citado 2026 mar. 04 ] - Characterization of textured polycrystalline diamond by electron spin resonance spectroscopy
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