External-PIXE analysis for the study of pigments from a painting from the Museum of Contemporary Art (2014)
- Autores:
- Autores USP: RIZZUTTO, MARCIA DE ALMEIDA - IF ; ADDED, NEMITALA - IF ; TABACNIKS, MANFREDO HARRI - IF
- Unidade: IF
- Assuntos: RAIOS X; FLUORESCÊNCIA
- Idioma: Inglês
- Imprenta:
- Fonte:
- Título do periódico: NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS
- Volume/Número/Paginação/Ano: v. 332, p. 411-414, aug. 2014
- Nome do evento: International Conference on Ion Beam Analysis (IBA)
-
ABNT
RIZZUTTO, Marcia de Almeida et al. External-PIXE analysis for the study of pigments from a painting from the Museum of Contemporary Art. NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS. Amsterdam: Instituto de Física, Universidade de São Paulo. Disponível em: http://www.sciencedirect.com/science/article/pii/S0168583X14003656. Acesso em: 19 set. 2024. , 2014 -
APA
Rizzutto, M. de A., Magalhaes, A. G., Barbosa, M., Moro, M. V., Trindade, G. F., Silva, T. F., et al. (2014). External-PIXE analysis for the study of pigments from a painting from the Museum of Contemporary Art. NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS. Amsterdam: Instituto de Física, Universidade de São Paulo. Recuperado de http://www.sciencedirect.com/science/article/pii/S0168583X14003656 -
NLM
Rizzutto M de A, Magalhaes AG, Barbosa M, Moro MV, Trindade GF, Silva TF, Kajiya EM, Campos PHV, Added N, Tabacniks MH. External-PIXE analysis for the study of pigments from a painting from the Museum of Contemporary Art [Internet]. NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS. 2014 ; 332 411-414.[citado 2024 set. 19 ] Available from: http://www.sciencedirect.com/science/article/pii/S0168583X14003656 -
Vancouver
Rizzutto M de A, Magalhaes AG, Barbosa M, Moro MV, Trindade GF, Silva TF, Kajiya EM, Campos PHV, Added N, Tabacniks MH. External-PIXE analysis for the study of pigments from a painting from the Museum of Contemporary Art [Internet]. NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS. 2014 ; 332 411-414.[citado 2024 set. 19 ] Available from: http://www.sciencedirect.com/science/article/pii/S0168583X14003656 - X-ray production yield in standardized thick target PIXE
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