@inbook{inbookcc950226,
title   = {A new method for determination of the fixed charge density at the buried oxide/underlying substrate interface in SOI MOSFETs},
author = {Pavanello, Marcelo Antonio and Martino, João Antonio},
year = {1997},
publisher = {The Electrochemical Society},
booktitle   = {Symposium Silicon-on-Insulator Technology and Devices}
}