@article{articlee3f6272d,
title   = {Optimization techniques for the estimation of the thickness and the optical parameters of thin films using reflectance data},
author = {Ventura, S. D. and Birgin, Ernesto Julian Goldberg and Martinez, Jesus Manuel and Chambouleyron, Ivan Emílio},
year = {2005},
doi = {10.1063/1.1849431},
journal   = {Journal of Applied Physics}
}