TY - CPAPER TI - Electrical characterization of MOS capacitors with gate of nickel/aluminum PY - 2001 AU - Navia, Alan Rodrigo AU - Santos Filho, Sebastião Gomes dos T2 - Workshop of SIBRATI J2 - Extended Abstracts UR - http://www.lsi.usp.br/ PP - São Paulo PB - EPUSP ER -