@inproceedings{inproceedings568b4563,
title   = {Influence of the back interface accumulation on the interface traps density extraction in thin film SOI nMOSFET},
author = {Sonnenberg, Victor and Martino, João Antonio},
year = {1997},
publisher = {SBMICRO/EFEI},
booktitle   = {Conference of the Brazilian Microelectronics Society}
}