Machine condition monitoring in FDM based on electret microphone, SVM, and neural networks - Lopes, Thiago Glissoi; Aguiar, Paulo Roberto; Monson, Paulo Monteiro de Carvalho; D'Addona, Doriana Marilena; Conceição Junior, Pedro de Oliveira; Oliveira Junior, Reinaldo Götz de (International Journal of Advanced Manufacturing Technology, 2023)