Ionizing radiation hardness tests of GaN HEMTs for harsh environments - Vilas Bôas, Alexis C.; Melo, M.A.A. de; Santos, R. B. B.; Giacomini, R.; Medina, Nilberto Heder; Seixas, L. E.; Finco, S.; Palomo, F. R.; Romero-Maestre, A.; Guazzelli, Marcilei A. (Microelectronics Reliability, 2021)