Growth process and grain boundary defects in Er doped BaTiO3 processed by EB-PVD: a study by XRD, FTIR, SEM and AFM - Huaman, Jose Luis Clabel; Awan, Iram Taj; Rivera, V. A. G.; Nogueira, I. C.; Silva, Marcelo de Assumpção Pereira da; Siu Li, Máximo; Ferreira, S. O.; Marega Junior, Euclydes (Applied Surface Science, 2019)