Analysis of proton irradiated n- and p-type strained FinFETs at low temperatures down to 100 K - Caparroz, Luís Felipe Vicentis; Agopian, Paula Ghedini Der; Claeys, Cor; Simoen, Eddy; Bordallo, Caio Cesar Mendes; Martino, João Antonio (Semiconductor Science and Technology, 2018)