The Influence of Oxide Thickness and Indium Amount on the Analog Parameters of InxGa1–xAs nTFETs - Bordallo, Caio Cesar Mendes; Collaert, Nadine; Claeys, Cor; Simoen, Eddy; Vandooren, A; Rooyackers, Rita; Mols, Yannick; Alian, A; Agopian, Paula Ghedini Der; Martino, João Antonio (IEEE Transactions on Electron Devices, 2017)