Impact of Gate Stack Layer Composition on Dynamic Threshold Voltage and Analog Parameters of Ge pMOSFETs - Oliveira, Alberto Vinicius de; Simoen, Eddy; Thean, Aaron; Agopian, Paula Ghedini Der; Martino, João Antonio; Claeys, Cor; Mertens, Hans; Collaert, Nadine (ECS Transactions volume 66 issue 5 on pages 309 to 314, 2016)