Low-frequency noise assessment in advanced UTBOX SOI nMOSFETs with different gate dielectrics - Santos, Sara Dereste dos; Martino, João Antonio; Cretu, B; Strobel, V; Routoure, J.-M; Carin, R; Aoulaiche, Marc; Jurczak, Malgorzata; Claeys, Cor (Solid-State Electronics, 2014)