Leakage current and threshold voltage alteration due to X-rays and proton beam in nMOSFETs with different geometries. - Silveira, Marcilei Aparecida Guazzelli da; Medina, Nilberto Heder; Added, Nemitala; Tabacniks, Manfredo Harri; Santos, R B; Cirne, Karin Huscher; Gimenez, S P; Lima, J A De; Seixas, L E (Latin American Symposium on Nuclear Physics and Applications, 2011)