Raman measurements of vertical conductivity and localization effects in strongly coupled semiconductor periodical structures - Pusep, Yuri A; Silva, M. T. O.; Galzerani, J. C.; Rodrigues, S. C. P.; Scolfaro, L. M. R.; Lima, A. P.; Quivy, Alain André; Leite, J. R.; Moshegov, N. T.; Basmaji, Pierre (Journal of Applied Physics, 2000)