@inproceedings{inproceedings6dcb316c,
title   = {Reliability Assessment of Arm Cortex-M Processors under Heavy Ions and Emulated Fault Injection},
author = {Gobatto, Leonardo R. and Benevenuti, Fabio and Added, Nemitala and Alberton, Saulo and Macchione, Eduardo L. A. and Aguiar, Vitor A. P. and Medina, Nilberto Heder and Kastensmidt, Fernanda L and Azambuja, Jose Rodrigo},
year = {2024},
doi = {10.1109/LATS62223.2024.10534599},
publisher = {IEEE},
booktitle   = {IEEE 25th Latin American Test Symposium (LATS)}
}