@inproceedings{inproceedings0a559e50,
title   = {Heavy Ion-Induced Faults on Programmable UART Controllers Embedded into SRAM-Based FPGA},
author = {Costa, Victor O. and Benevenuti, Fabio and Menezes, Renan and Sato, Lidia Shibuya and Loures, Luis and Kastensmidt, Fernanda L and Added, Nemitala and Alberton, Saulo and Aguiar, Vitor A. P. and Medina, Nilberto Heder},
year = {2024},
doi = {10.1109/LATS62223.2024.10534591},
publisher = {IEEE},
booktitle   = {IEEE 25th Latin American Test Symposium (LATS)}
}