@article{articlee4019f5f,
title   = {DIBL behavior of triple gate FinFETs with SEG on biaxial strained devices},
author = {Santos, Sara Dereste dos and Nicoletti, Talitha and Martino, João Antonio and Simoen, Eddy and Claeys, Cor},
year = {2010},
doi = {10.1149/1.3474141},
journal   = {Microelectronics Technology and Devices - SBMicro 2010}
}