@inproceedings{inproceedings305e7c3b,
title   = {Biaxial stress simulation and electrical characterization of triple-gate SOI nMOSFETs.},
author = {Bühler, Rudolf Theoderich and Agopian, Paula Ghedini Der and Simoen, Eddy and Claeys, Cor and Martino, João Antonio},
year = {2012},
doi = {10.1149/04901.0145ecst},
booktitle   = {International Symposium on Microelectronics Technology and Devices}
}