@article{article7dcc9fcf,
title   = {Unsupervised machine learning application to identify single-event transients (SETs) from noise events in MOSFET transistor ionizing radiation effects},
author = {Allegro, Paula Rangel Pestana and Aguiar, Vitor Ângelo Paulino de and Added, Nemitala and Medina, Nilberto Heder and Macchione, Eduardo Luiz Augusto and Alberton, Saulo Gabriel Pereira Nascimento},
year = {2023},
doi = {10.1016/j.microrel.2023.114916},
publisher = {Elsevier},
journal   = {Microelectronics Reliability}
}