@article{articlef40537ef,
title   = {Charge deposition analysis of heavy-ion-induced single-event burnout in low-voltage power VDMOSFET},
author = {Alberton, S. G. and Aguiar, Vitor^Ângelo Paulino de and Medina, Nilberto Heder and Added, Nemitala and Macchione, E L A and Menegasso, R. and Cesário, G. J. and Santos, Hellen Cristine and Scarduelli, Valdir Brunetti and Alcántara-Núñez, J. A. and Guazzelli, M. A. and Santos, R. B. B. and Flechas, D.},
year = {2022},
doi = {10.1016/j.microrel.2022.114784},
journal   = {Microelectronics Reliability}
}