@inproceedings{inproceedingsed8d76a4,
title   = {Assessment of Ionizing Radiation Hardness of a GaN Field-Effect Transistor},
author = {Bôas, Alexis Cristiano Vilas and Melo, M A A de and Santos, R B B and Giacomini, R C and Medina, Nilberto Heder and Seixas, L E and Palomo, F R and Guazzelli, Marcilei Aparecida},
year = {2020},
doi = {10.1109/SBMicro.2019.8919340},
publisher = {Institute of Electrical and Electronics Engineers},
booktitle   = {Symposium on Microelectronics Technology and Devices (SBMicro)}
}