@article{article1b996265,
title   = {Dynamic heavy ions SEE testing of NanoXplore radiation hardened SRAM-based FPGA: Reliability-performance analysis},
author = {Oliveira, A and Added, Nemitala and Medina, Nilberto Heder},
year = {2019},
doi = {10.1016/j.microrel.2019.113437},
journal   = {Microelectronics Reliability Volumes 100–101, September 2019, 113437}
}