@inproceedings{inproceedings496f7ac4,
title   = {Passivation layer and charge collection depth in electronic devices},
author = {Aguiar, Vitor Ângelo Paulino de and Medina, Nilberto Heder and Added, Nemitala and Aguiar, Vitor Ângelo Paulino de and Macchione, Eduardo Luiz Augusto and Leite, A. R. and Silva, Tiago Fiorini da and Rodrigues, Cleber Lima and Escudeiro, R. and Allegro, Paula Rangel Pestana and Santos, H. C. and Alberton, S. G. and Scarduelli, Valdir Brunetti and Silveira, M. A. G. and Melo, M. A. A. de and Santos, R. B. B. and Giacomini, R. and Oliveira, J. A. and Leite, F. G. H. and Sayeg, Isaac Jamil},
year = {2018},
booktitle   = {Brazilian Meeting on Nuclear Physics}
}