@article{article9f9aa164,
title   = {GR-Noise Characterization of Ge pFinFETs With STI First and STI Last Processes},
author = {Oliveira, Alberto Vinicius de and Simoen, Eddy and Mitard, Jerome and Agopian, Paula Ghedini Der and Langer, Robert and Witters, Liesbeth J and Martino, João Antonio},
year = {2016},
doi = {10.1109/led.2016.2595398},
journal   = {IEEE Electron Device Letters}
}