@article{article67e84fa3,
title   = {Low-Frequency Noise Assessment of Different Ge pFinFET STI Processes},
author = {Oliveira, Alberto Vinicius de and Simoen, Eddy and Mitard Jerome and Agopian, Paula Ghedini Der and Langer, Robert and Witters, Liesbeth J and Martino, João Antonio},
year = {2016},
doi = {10.1109/ted.2016.2598288},
journal   = {IEEE Transactions on Electron Devices}
}