@article{article2800b861,
title   = {Different stress techniques and their efficiency on triple-gate SOI n-MOSFETs},
author = {Bühler, Rudolf Theoderich and Agopian, Paula Ghedini Der and Collaert, Nadine and Simoen, Eddy and Claeys, Cor and Martino, João Antonio},
year = {2015},
doi = {10.1016/j.sse.2014.07.010},
journal   = {Solid-State Electronics}
}