@article{article706c8852,
title   = {Low-frequency noise assessment in advanced UTBOX SOI nMOSFETs with different gate dielectrics},
author = {Santos, Sara Dereste dos and Martino, João Antonio and Cretu, B and Strobel, V and Routoure, J.-M and Carin, R and Aoulaiche, Marc and Jurczak, Malgorzata and Claeys, Cor},
year = {2014},
doi = {10.1016/j.sse.2014.04.034},
journal   = {Solid-State Electronics}
}