@article{article08d21bd9,
title   = {Analog performance of standard and uniaxial strained triple-gate SOI FinFETs under x-ray radiation},
author = {Bordallo, Caio Cesar Mendes and Martino, João Antonio and Teixeira, Fernando Ferrari and Silveira, Marcilei Aparecida Guazzelli da and Agopian, Paula Ghedini Der and Simoen, Eddy and Claeys, Cor},
year = {2014},
doi = {10.1088/0268-1242/29/12/125015},
journal   = {Semiconductor Science and Technology}
}