@article{article9fea6825,
title   = {Investigation of Bulk and DTMOS triple-gate devices under 60 MeV proton irradiation},
author = {Caño de Andrade, Maria Glória and Collaert, Nadine and Simoen, Eddy and Claeys, Cor and Aoulaiche, Marc and Martino, João Antonio},
year = {2014},
doi = {10.1016/j.microrel.2014.06.013},
journal   = {Microelectronics Reliability}
}