@article{articleade29f16,
title   = {Stress engineering and proton radiation influence on off-state leakage current in triple-gate SOI devices},
author = {Agopian, Paula Ghedini Der and Bordallo, Caio Cesar Mendes and Simoen, Eddy and Martino, João Antonio and Claeys, Cor},
year = {2013},
doi = {10.1016/j.sse.2013.02.037},
journal   = {Solid-State Electronics Volume 90, December 2013, Pages 155-159}
}