@article{article857fbeb4,
title   = {Nanoscale characterization of bismuth telluride epitaxial layers by advanced X-ray analysis},
author = {Morelhão, Sérgio Luiz and Fornari, Celso I and Rappl, Paulo Henrique de Oliveira and Abramof, Eduardo},
year = {2017},
doi = {10.1107/S1600576717000760},
journal   = {Journal of Applied Crystallography}
}